Semiconductor Inspection
JDSU is at the forefront of laser development for precision semiconductor inspection with ultra-stable single frequency continuous wave (CW) and Quasi-CW systems. These lasers are ideal for the high speed wafer inspection and provide manufacturers with the ability to detect nanometer scale defects and contamination.
Laser Head, Argon, High Power, Cylindrical (2213 Series)
Laser Head, Argon, Low Power (2218/19 Series)
Laser Head, Argon, Low Power, Cylindrical/Rectangular (2211/14 Series)
Laser Head, Helium Neon (1100 Series)
Laser Head, Helium Neon (1600 Series)
Laser Power Supply, Argon (Ultra Series)
Laser Power Supply, Helium Neon
Laser Tube, Helium Neon (098 and 1000 Series)
Laser, Helium Neon, Self Contained (1500 Series)
Laser, Solid-State, CW 488 (FCD488)
Laser, Solid-State, CW, 532 (CDPS532M)
Laser, Solid-State, CW, 532 (NPRO 142)
Laser, Solid-State, CW, 532, Compact (CDPS532S)
Laser, Solid-State, Quasi-CW, 355 (Xcyte)
